Laser solutions for integrated circuits testing
For more than 15 years, ALPhANOV has been supporting the hardware security community by developing optical and laser solutions for integrated circuits testing.
Discover here the high quality and high precision equipments for laser fault injection, photon emission imaging and counting and thermal laser stimulation enabling the extraction of information
Our product range
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Laser fault injection quadruple spots - Q-LMS
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LFI Pico laser
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Single laser fault injection microscope - S-LMS
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Double laser fault injection microscope - D-LMS
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PDM laser sources - Pulse-on-demand Modules
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Photon Emission optical bench
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Thermal Laser Stimulation - TLS
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"Laser fault injection" training
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Tombak - Pulse Delay Generator
Our related collaborative projects
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ASCRIPT - Safety Analysis of Integrated Circuits by PhotoThermal Effect
Developing new methods of evaluation and safety improvements for integrated circuits concerning an imaging technique that uses a laser as a heat source.
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PILAS - Advanced Laser Injection for Security Analyses
Develop an injection system and methodology for advanced multipoint faults using three to four laser beams.
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