Laser solutions for integrated circuits testing
For more than 10 years, ALPhANOV has been developing optical and laser solutions for integrated circuits testing. Discover here the top-of-the-range and high-precision equipment for fault injection by laser, analysis of photonic emissions of integrated circuits or thermal stimulation by laser for reading the condition of transistors.
Our range of products
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LFI Pico laser
A source generating 60 picosecond pulses for laser fault injection in integrated circuits. -
Single laser fault injection microscope - S-LMS
The S-LMS microscope station for laser fault injection is a high-precision platform for security evaluation of integrated circuits. It allows you to focus the laser spot and scan the sample through the back side in order to evaluate the security levels of the electronic components. -
Double laser fault injection microscope - D-LMS
The D-LMS microscope station for double laser fault injection is a platform allowing to focus and scan independently two laser spots for security evaluation of integrated circuits. Ideal for double spot injection processes, it offers all the spatial and temporal flexibility to analyze circuits through the back side. -
PDM laser sources - Pulse-on-demand Modules
PDM laser sources are specially designed for security evaluation of integrated circuits. Reliable and robust, these laser sources allow you to generate pulses on demand of less than 1 nanosecond, up to continuous with a timing precision of 8 ps and a spot size of 1 µm. -
Photoemission optical bench
When an integrated circuit is in operation, the zones requested by the routine naturally emit infrared photons via the rear panel. ALPhANOV’s photoemission optical bench allows you to capture and visualise these photonic emissions in order to obtain a precise view of the circuit activity. -
Thermal Laser Stimulation - TLS
The thermal laser stimulation bench is an optical microscope which enables to focus with precision, a PDM+ laser source (Pulse-on-Demand Module) at 1420 nm. Used through the back side of electronic components, the laser beam warms the sample locally and allows to extract and read out data in a memory according to the current consumption of the transistors. -
"Laser fault injection" training
"Laser fault injection" training is dedicated to carrying out laser fault injection campaigns on integrated circuits. She's aimed at cybersecurity and cryptanalysis professionals wishing to develop their expertise in the safety assessment of electronic components. -
Tombak: Pulse Delay Generator
This pulse delay generator generates high frequency pulses, digital delays and bursts. It is an ideal synchronization and timing control instrument for electronics and lasers.
Our related collaborative projects
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ASCRIPT - Safety Analysis of Integrated Circuits by PhotoThermal Effect
Developing new methods of evaluation and safety improvements for integrated circuits concerning an imaging technique that uses a laser as a heat source.
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PILAS - Advanced Laser Injection for Security Analyses
Develop an injection system and methodology for advanced multipoint faults using three to four laser beams.
Learn more