Reliability test system for laser diode qualification in pulsed or CW regime
Life-test and qualification test system for laser diode reliability evaluation in CW or pulsed regime down to 1 nanosecond. Up to 112 fully independent fibered devices are electrically, thermally and optically tested according to one or several user-programmed test scenarios.
This laser diode reliability test system has been specially designed for the qualification and test of fiber-coupled devices with the maximum of internal and external measurement flexibility. The laser diode optical power is measured independently from the BFMs or some external photodiodes with variable gain for a better precision. It allows to adjust precisely the temperature of each laser diode package and each laser diode chip independently. It includes several levels of secured data management to ensure data integrity even through power blackout.
Butterfly laser diodes like II-VI, Lumentum or 3SP are perfectly well tested.
These products are now offered by AeroDIODE, 
a new ALPhANOV spin-off company. The product manager is available to answer any technical of commercial question.
Product reference: Multidiode
Key features
- From CW (Continuous Wave) down to less than 1 ns pulse width
- CW-LIV and Pulsed-LIV testing to avoid thermal effects
- 100% independent behavior of each laser diode
- Ideal for Butterfly or other fiber coupled packages (Mini-Butterfly, TOSA, TO-Can etc.)
- Embedded flash memory in each tray of 8 laser diodes
- Programming supervisory GUI with easy-to-use graphical interface
- Full laser protection with special protective window
Applications of this laser diode reliability test system includes any qualifications, life-test or Burn-in tests:
- In parallel of the production process for R&D and qualification teams
- At the end the laser diode production process.
- After the production when considering applications requiring high reliability levels, like aerospace, nuclear plant etc.
A dedicated programming supervisory GUI with easy-to-use graphical interface lets the user have total control of all module functions independantly. It includes several libraries for software integration (LabVIEW VIs, DLLs, Hexa etc.).
Datasheet
This laser diode reliability tests system is the most complete system coming from our wide experience in pulsed laser diode drivers. If you are interested in a lower number of channels or a multichannel driver with no need for reliability testing functionalities, you may consider the following products:
- Laser driver
- Low noise laser diode driver
- Pulsed laser diode driver
- Multi-channel laser diode driver
- TDLAS
- 808 nm laser diode
- 915 nm laser diode
- 980 nm laser diode
- 1064 nm laser diode
- 1550 nm laser diode
- Fiber coupled acousto-optic modulator
Specifications
| Capacity | Up to 112 fibered devices |
| Diode chip temperature range (°C) | 10 - 55 |
| Diode package temperature range (°C) | 20 - 85 |
| Temperature stability (Typ) | < 1 mK |
| Control loop | ACC, APC, LIV |
| Current range (CW) | 1 - 2500 mA |
| Current range (pulsed peak current) | 1 - 4000 mA |
| Pulse duration | 0.5ns to CW |
| Compliance voltage (adjustable) | 1 - 24 V |
| Pulse overshoot (adjustable) | Down to 0% |
| BFM/Ext photodiode measurement | Yes / Yes |
| Internal CW LIV / Pulsed LIV | Yes / Yes (provisional) |
| Current modulation | External or internal: sin/sqr/triang |
| Drive types | 100% individual setpoints and test scenario |
| Laser drive current setpoint resolution | Down to 25 µA |
| Laser drive current stability | < 0.1 mA |
| Internal embedded memory (per tray of 8 diodes) | 50 Go |
GUI interface
These products are now offered by AeroDIODE, a new ALPhANOV spin-off company.
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